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Scanning Tunneling
Microscopy and its Application
Author: Chunli Bai
Publisher: Springer-Verlag Berlin Heidelberg New York
ISBN 3-540-59346-2
Brief Introduction
Scanning Tunneling Microscopy and its Application presents a
unified view of the rapidly growing field of STM, and its many
derivatives. A thorough discussion of the various principles
provides the background of the tunneling phenomena and leads to
the many novel scanning-probe techniques, such as AFM, MFM, BEEM,
PSTM, etc. After having examined the available instrumentation and
the methods for tip and surface preparations, the monograph
provides detailed accounts of STM application to metal and
semi-conductor surfaces, absorbates and surface chemistry, biology,
and nano-fabrication. It examines limitations of the present-day
investigations, and provides hints toward further trends. |