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Several
techniques in AFM rely on removing topographical information from some
other signal. Magnetic force imaging and Electric force imaging work by
first determining the topography along a scan line, and then lifting a
pre-determined distance above the surface to re-trace the line following
the contour of the surface.
In this way, the tip-sample distance should be unaffected by topography,
and an image can be built up by recording changes which occur due to
longer range force interactions, such as magnetic forces and electric
force.
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1. Scan a line in Tapping Mode
for topography.
2.
Back to initial of the line, tip lifting a distance and re-trace the
line following the contour of the surface, effects by long-range force
on tip Amplitude and Phase will be obtained.
3. According to the to-be-obtained forces, exclusive
cantilever must be chosen. |
